发明名称 LED CHIP TESTING DEVICE
摘要 PURPOSE: An LED chip inspection apparatus is provided to prevent the separation of an LED chip on an inspection area when the bottom of a probe unit contacts the LED chip. CONSTITUTION: An optical characteristic inspection unit(27) inspects optical characteristics of an LED chip. A chip safe arrival block places the LED chip and transfers the LED chip to an inspection area of the optical characteristic inspection unit. A probe card(41) contacts or separated from an electrical connection unit of the bottom of the LED chip which is transferred to the inspection area. A chip fixing unit(21) is formed in the inspection area and prevents the secession of the LED chip. A rotary index unit comprises a rotor and a rotary driver.
申请公布号 KR101184683(B1) 申请公布日期 2012.09.20
申请号 KR20110053398 申请日期 2011.06.02
申请人 INNOBIZ CO., LTD. 发明人 JUNG, TAE JIN
分类号 G01R31/26;G01R1/073;H01L21/66 主分类号 G01R31/26
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