发明名称 METHOD FOR FORMING A GE ON III/V-ON-INSULATOR STRUCTURE
摘要 PURPOSE: A method for forming a Ge(germanium) structure on III/V on an insulator is provided to include a lower approach resistance source and a drain contact by forming high-mobility channel transistor. CONSTITUTION: A relaxed Ge layer(2) is grown on a donor substrate. One or more layers(3) of a III/V substance are grown on the Ge layer. A division surface(6) is formed in the Ge layer. A divided part of the donor substrate is moved to a supporting substrate(4). The divided part is a part of the donor substrate divided form the division surface including one or more layers of the III/V substance.
申请公布号 KR20120103437(A) 申请公布日期 2012.09.19
申请号 KR20120003750 申请日期 2012.01.12
申请人 SOITEC 发明人 DAVAL NICOLAS;NGUYEN BICH YEN;AULNETTE CECILE;BOURDELLE KONSTANTIN
分类号 H01L21/84;H01L27/12 主分类号 H01L21/84
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