发明名称 |
METHOD FOR FORMING A GE ON III/V-ON-INSULATOR STRUCTURE |
摘要 |
PURPOSE: A method for forming a Ge(germanium) structure on III/V on an insulator is provided to include a lower approach resistance source and a drain contact by forming high-mobility channel transistor. CONSTITUTION: A relaxed Ge layer(2) is grown on a donor substrate. One or more layers(3) of a III/V substance are grown on the Ge layer. A division surface(6) is formed in the Ge layer. A divided part of the donor substrate is moved to a supporting substrate(4). The divided part is a part of the donor substrate divided form the division surface including one or more layers of the III/V substance. |
申请公布号 |
KR20120103437(A) |
申请公布日期 |
2012.09.19 |
申请号 |
KR20120003750 |
申请日期 |
2012.01.12 |
申请人 |
SOITEC |
发明人 |
DAVAL NICOLAS;NGUYEN BICH YEN;AULNETTE CECILE;BOURDELLE KONSTANTIN |
分类号 |
H01L21/84;H01L27/12 |
主分类号 |
H01L21/84 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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