发明名称 PROVIDING ROW REDUNDANCY TO SOLVE VERTICAL TWIN BIT FAILURES
摘要 PURPOSE: A method and circuit for providing row redundancy to solve vertical twin bit failures are provided to reduce a chip area by including a small register which stores one of row addresses in a failure row. CONSTITUTION: A failure address register(24) stores a first row address and is connected to a first comparator(20). A row address modifier(26) generates a second row address by modifying the first row address received from the failure address register. The first comparator compares the first row address with a third row address. A second comparator(30) compares the second row address with the third row address. [Reference numerals] (AA) 0 row; (BB) 2^n-1 row
申请公布号 KR20120103398(A) 申请公布日期 2012.09.19
申请号 KR20110074727 申请日期 2011.07.27
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 CHENG HONG CHEN;YANG JUNG PING;LU CHUNG JI;TAO DEREK C.;LEE CHENG HUNG;LIAO HUNG JEN
分类号 G11C8/06 主分类号 G11C8/06
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