发明名称 |
PROVIDING ROW REDUNDANCY TO SOLVE VERTICAL TWIN BIT FAILURES |
摘要 |
PURPOSE: A method and circuit for providing row redundancy to solve vertical twin bit failures are provided to reduce a chip area by including a small register which stores one of row addresses in a failure row. CONSTITUTION: A failure address register(24) stores a first row address and is connected to a first comparator(20). A row address modifier(26) generates a second row address by modifying the first row address received from the failure address register. The first comparator compares the first row address with a third row address. A second comparator(30) compares the second row address with the third row address. [Reference numerals] (AA) 0 row; (BB) 2^n-1 row
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申请公布号 |
KR20120103398(A) |
申请公布日期 |
2012.09.19 |
申请号 |
KR20110074727 |
申请日期 |
2011.07.27 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
发明人 |
CHENG HONG CHEN;YANG JUNG PING;LU CHUNG JI;TAO DEREK C.;LEE CHENG HUNG;LIAO HUNG JEN |
分类号 |
G11C8/06 |
主分类号 |
G11C8/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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