发明名称 Method of manufacturing semiconductor device, and semiconductor device
摘要 There are provided a method of manufacturing a semiconductor device which achieves a reduction in implantation masks, and such a semiconductor device. By implanting boron into NMOS regions using a resist mask and another resist mask as the implantation masks, p-type impurity regions serving as the halo regions of access transistors and drive transistors are formed. By further implanting phosphorus or arsenic into a PMOS region using another resist mask as the implantation mask, n-type impurity regions serving as the halo regions of load transistors are formed.
申请公布号 US8269284(B2) 申请公布日期 2012.09.18
申请号 US201113019600 申请日期 2011.02.02
申请人 NIL KOJI;IGARASHI MOTOSHIGE;RENESAS ELECTRONICS CORPORATION 发明人 NIL KOJI;IGARASHI MOTOSHIGE
分类号 H01L27/088;H01L21/8234 主分类号 H01L27/088
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