发明名称 METHOD OF FABRICATING THE SEMICONDUCTOR MEMORY DEVICE
摘要 PURPOSE: A method for manufacturing a semiconductor memory device is provided to remove a cell open photo process to expose a buried contact layer in a cell array region by exposing the buried contact layer in the cell array region using an etching process. CONSTITUTION: A semiconductor substrate(110) with a bottom layer(120) is prepared. An insulation layer is formed on the bottom layer. A core/peri signal transmission conductive layer(140) is formed on the insulation layer of the core/peri region. A capping insulation layer is formed on the insulation layer and the core/peri signal transmission conductive layer. The capping insulation layer is etched to expose the bottom layer in the cell array region. A stopper layer(132) is formed on the front side of the core/peri region and the bottom layer. [Reference numerals] (AA) Cell region; (BB) Core/Peri region
申请公布号 KR20120102449(A) 申请公布日期 2012.09.18
申请号 KR20110020621 申请日期 2011.03.08
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, WON MO;HWANG, MIN WK;KIM, HYUN CHUL
分类号 H01L21/8242;H01L27/108 主分类号 H01L21/8242
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