发明名称 |
Apparatus for observing the surface of a sample |
摘要 |
An apparatus for observing the appearance of a surface of a sample of semitransparent material, the apparatus comprising a light source for illuminating at least a region of interest of the surface of the sample from a predetermined direction and means for observing a response to the illumination of the region of interest, wherein the illuminated region comprises the region of interest and a region surrounding the region of interest. In this way the influence of emitted scattered light on the accuracy of the observation of the appearance of the sample is minimized.
|
申请公布号 |
US8269983(B2) |
申请公布日期 |
2012.09.18 |
申请号 |
US20080679357 |
申请日期 |
2008.09.23 |
申请人 |
WADMAN SIPKE;KONINKLIJKE PHILIPS ELECTRONICS N.V. |
发明人 |
WADMAN SIPKE |
分类号 |
G01B11/30;A61N5/01;G01N21/55 |
主分类号 |
G01B11/30 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|