发明名称 Apparatus for observing the surface of a sample
摘要 An apparatus for observing the appearance of a surface of a sample of semitransparent material, the apparatus comprising a light source for illuminating at least a region of interest of the surface of the sample from a predetermined direction and means for observing a response to the illumination of the region of interest, wherein the illuminated region comprises the region of interest and a region surrounding the region of interest. In this way the influence of emitted scattered light on the accuracy of the observation of the appearance of the sample is minimized.
申请公布号 US8269983(B2) 申请公布日期 2012.09.18
申请号 US20080679357 申请日期 2008.09.23
申请人 WADMAN SIPKE;KONINKLIJKE PHILIPS ELECTRONICS N.V. 发明人 WADMAN SIPKE
分类号 G01B11/30;A61N5/01;G01N21/55 主分类号 G01B11/30
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