发明名称 APPARATUS FOR INSPECTING PICK-UP OF CHIP
摘要 PURPOSE: A device for inspecting component absorption is provided to photograph fiducial mark images and lateral images of parts with one camera when inspecting lateral surfaces of the parts being attached on a fiducial mark and a nozzle, thereby reducing a volume of part inspecting equipment and costs for manufacturing the equipment. CONSTITUTION: A device for inspecting component absorption comprises a first front lens(310), a second front lens(320), a first reflecting plate(410), a second reflecting plate(420), and a beam splitter(500). The first front lens accepts a first shape with respect to a fiducial mark marked on a printed circuit substrate. The second front lens accepts a second shape with respect to a lateral surface of a part being absorbed on a nozzle. The first reflecting plate reflects the first shape. The second reflecting plate reflects the second shape. The beam splitter transmits the first shape transmitted through the first front lens and reflected by the first reflecting plate and makes the same incident to a camera and reflects the second shape transmitted through the second front lens and reflected by the second reflecting plate and makes the same incident to the camera.
申请公布号 KR20120101866(A) 申请公布日期 2012.09.17
申请号 KR20110019944 申请日期 2011.03.07
申请人 SAMSUNG TECHWIN CO., LTD. 发明人 KANG, MIN SOO
分类号 G01B11/00;H01L21/66 主分类号 G01B11/00
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