发明名称 |
SYSTEM AND METHOD OF MEASURING IRREGULLARITY OF A GLASS PLATE |
摘要 |
PURPOSE: A system and a method for measuring the ununiformity degree of a glass substrate are provided to measure the ununiformity degree by using the glass substrate itself, thereby reducing time and costs required for measuring the ununiformity degree. CONSTITUTION: A system for measuring the ununiformity degree of a glass substrate comprises a light source unit(300) and a screen(200). The light source unit irradiates first lights on the glass substrate. The first lights reflected in the upper and lower surfaces of the glass substrate. First reflection lights reflected by the upper surface of the glass substrate are incident to the screen, thereby forming a first strip. Second reflection lights reflected by the lower surface and output are incident to the screen, thereby forming a second strip. The light source unit and the screen are arrayed based on the glass substrate so that the first and second strips are formed by being separated. [Reference numerals] (300) Light source unit; (400) Detection unit; (410) Non-uniformity estimation unit
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申请公布号 |
KR20120101622(A) |
申请公布日期 |
2012.09.14 |
申请号 |
KR20120095129 |
申请日期 |
2012.08.29 |
申请人 |
SEMISYSCO CO., LTD. |
发明人 |
LEE, SOON JONG;WOO, BONG JOO;PARK, BYOUNG CHAN;CHOI, SEONG JIN;CHUNG, JAE HOON |
分类号 |
G01N21/958;G01B11/30 |
主分类号 |
G01N21/958 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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