发明名称 SYSTEM AND METHOD OF MEASURING IRREGULLARITY OF A GLASS PLATE
摘要 PURPOSE: A system and a method for measuring the ununiformity degree of a glass substrate are provided to measure the ununiformity degree by using the glass substrate itself, thereby reducing time and costs required for measuring the ununiformity degree. CONSTITUTION: A system for measuring the ununiformity degree of a glass substrate comprises a light source unit(300) and a screen(200). The light source unit irradiates first lights on the glass substrate. The first lights reflected in the upper and lower surfaces of the glass substrate. First reflection lights reflected by the upper surface of the glass substrate are incident to the screen, thereby forming a first strip. Second reflection lights reflected by the lower surface and output are incident to the screen, thereby forming a second strip. The light source unit and the screen are arrayed based on the glass substrate so that the first and second strips are formed by being separated. [Reference numerals] (300) Light source unit; (400) Detection unit; (410) Non-uniformity estimation unit
申请公布号 KR20120101622(A) 申请公布日期 2012.09.14
申请号 KR20120095129 申请日期 2012.08.29
申请人 SEMISYSCO CO., LTD. 发明人 LEE, SOON JONG;WOO, BONG JOO;PARK, BYOUNG CHAN;CHOI, SEONG JIN;CHUNG, JAE HOON
分类号 G01N21/958;G01B11/30 主分类号 G01N21/958
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