| 摘要 |
The invention relates to a device (100) for measuring the surface state of a surface (200), said surface comprising at least one portion (210) having a surface curvature (211). The device (100) has a probe (110) intended to be in contact with said surface portion (210), stressing means intended to stress the probe (110) on the surface (200) with a substantially constant stress, means for measuring the movement of the probe which are designed to measure the movement of the probe along an axis approximately perpendicular to the surface (200), and means (500) for relative movement of the probe. The means (500) for relative movement of the probe are designed to move the probe in relation to the surface (200) only along a path following the surface curvature (211). |
