| 摘要 |
The purpose of the present invention is to provide a device which measures the optical characteristic of an object to be measured and enables measurement of hemispherical total reflectance, hemispherical total transmittance, and light distribution, and to achieve a reduction in measurement time and an improvement in the accuracy of the quantitative analysis of hemispherical total reflectance (transmittance). A bielliptic optical system is an optical system having three focuses on one axis by joining two ellipsoidal mirrors with one of focuses of each of the ellipsoidal mirrors as a common focus, and is configured from a partial (quarter, for example) spheroidal mirror (2) and a belt-shaped spheroidal mirror (1). By installing a hemispherical surface detection optical system provided with a hemispherical lens (4) or a rotational parabolic mirror at the position of the focus of the partial spheroidal mirror, light scattered by an object to be measured, reflected by the mirror surface of the partial spheroidal mirror, and concentrated at the focus is photographed by a CCD camera (6), for example, via the hemispherical lens and a tapered optical fiber (5) to measure the optical characteristic of the object to be measured. |
