发明名称 LITHOGRAPHIC APPARATUS, METHOD OF CONTROLLING THE SAME AND DEVICE MANUFACTURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To reduce or eliminate risks of a defocusing error. <P>SOLUTION: An immersion lithographic apparatus is disclosed having a projection system configured to direct a patterned beam of radiation onto a substrate and a liquid handling system configured to supply and confine immersion liquid to a space defined between the projection system and a substrate, or a substrate table, or both. A controller is provided to adjust an angle of a lower surface of the liquid handling system relative to the top surface of the substrate during moving of the substrate and/or substrate table relative to the liquid handling system dependent upon a position of the substrate and/or substrate table relative to the liquid handling system and/or a direction of relative movement between the substrate and/or substrate table and the liquid handling system. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012178563(A) 申请公布日期 2012.09.13
申请号 JP20120032987 申请日期 2012.02.17
申请人 ASML NETHERLANDS BV 发明人 PIETER MULDER;JAN WILLEM CROMWIJK;VAN DE WINKEL JIMMY MATHEUS WILHELMUS;HOFMANN MARIAN LEONARDOUS KATHARINA;HENDRIK FERDINAND BERNALDOS JOHANNES WILHELMUS MARIA
分类号 H01L21/027;G03F7/20 主分类号 H01L21/027
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