发明名称 SAMPLE IONIZATION METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a sample ionization method which can be applied to an ionization device for a mass analyzer, which has excellent ionization efficiency and allows a minute amount of a sample to be analyzed with high sensitivity at atmospheric pressure and with which workload for maintenance of the mass analyzer can be reduced. <P>SOLUTION: In a sample ionization method, a sample to be mass analyzed is ionized by providing argon gas and water and applying ultraviolet rays to the sample at atmospheric pressure, thus oxonium ions (H<SB POS="POST">3</SB>O<SP POS="POST">+</SP>) are produced by reaction of excited argon gas with dimeric water (H<SB POS="POST">2</SB>O)<SB POS="POST">2</SB>. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012177604(A) 申请公布日期 2012.09.13
申请号 JP20110040381 申请日期 2011.02.25
申请人 UNIV KANAGAWA 发明人 MOCHIDA YOSHIYUKI
分类号 G01N27/62 主分类号 G01N27/62
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