发明名称 DEFECT REVIEW SUPPORT DEVICE, DEFECT REVIEW DEVICE AND INSPECTION SUPPORT DEVICE
摘要 To reduce the time taken to prepare a defect review report and to thereby improve the convenience of a defect review device or for an inspection system user. The above object is attained by implementing a review report preparation tool having a function to edit the layout of a review report in a data processing terminal.
申请公布号 US2012233542(A1) 申请公布日期 2012.09.13
申请号 US201013391313 申请日期 2010.06.23
申请人 FUNAKOSHI TOMOHIRO;HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 FUNAKOSHI TOMOHIRO
分类号 G06F17/00 主分类号 G06F17/00
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