发明名称 Vacuum Quality Measurement System
摘要 A gas analyzer for a vacuum chamber includes processing electronics configured to receive mass spectral data, receive input of total pressure in the vacuum chamber, receive external input from at least one sensor, and employ the mass spectral data, the total pressure in the vacuum chamber, and the external input from the at least one sensor to calculate a vacuum quality index based on at least one criteria of quality.
申请公布号 US2012227465(A1) 申请公布日期 2012.09.13
申请号 US201013508644 申请日期 2010.11.08
申请人 BRUCKER GERARDO A.;VAN ANTWERP, JR. KENNETH D. 发明人 BRUCKER GERARDO A.;VAN ANTWERP, JR. KENNETH D.
分类号 G01L21/00;G01N25/00 主分类号 G01L21/00
代理机构 代理人
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