发明名称 |
BLANKMASK, PHOTOMASK AND METHOD OF MANUFACTURING THE SAME |
摘要 |
PURPOSE: A blank mask, a photo-mask, and a method for manufacturing the same are provided to improve resolution and pattern accuracy. CONSTITUTION: A metal film and a hard film are successively stacked on a transparent substrate to form a blank mask. The metal film includes a light shielding film and an anti-reflective film. The thickness of the metal film is in a range between 200 and 500 angstrom. The metal content of the light shielding film is higher than the metal content of the anti-reflective film. The thickness ratio of the metal film to the hard film is 1:8.7-12.5. The reflectivity of the hard film to the metal film is 1.2 or more at a wavelength of 200nm or less. |
申请公布号 |
KR101172698(B1) |
申请公布日期 |
2012.09.13 |
申请号 |
KR20110105833 |
申请日期 |
2011.10.17 |
申请人 |
S&STECH CO., LTD. |
发明人 |
KANG, GEUNG WON;NAM, KEE SOO;LEE, JONG HWA;YANG, CHUL KYU;KWON, SOON GI |
分类号 |
G03F1/48;G03F1/80 |
主分类号 |
G03F1/48 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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