发明名称 BLANKMASK, PHOTOMASK AND METHOD OF MANUFACTURING THE SAME
摘要 PURPOSE: A blank mask, a photo-mask, and a method for manufacturing the same are provided to improve resolution and pattern accuracy. CONSTITUTION: A metal film and a hard film are successively stacked on a transparent substrate to form a blank mask. The metal film includes a light shielding film and an anti-reflective film. The thickness of the metal film is in a range between 200 and 500 angstrom. The metal content of the light shielding film is higher than the metal content of the anti-reflective film. The thickness ratio of the metal film to the hard film is 1:8.7-12.5. The reflectivity of the hard film to the metal film is 1.2 or more at a wavelength of 200nm or less.
申请公布号 KR101172698(B1) 申请公布日期 2012.09.13
申请号 KR20110105833 申请日期 2011.10.17
申请人 S&STECH CO., LTD. 发明人 KANG, GEUNG WON;NAM, KEE SOO;LEE, JONG HWA;YANG, CHUL KYU;KWON, SOON GI
分类号 G03F1/48;G03F1/80 主分类号 G03F1/48
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