发明名称 |
High Speed Test Circuit and Method |
摘要 |
A high speed test circuit receives a tester clock from a tester and it conducts a test on a circuit under test. The high speed test circuit generates a high frequency clock according to the tester clock, so it is capable of operating in two frequencies. The high speed test circuit tests the circuit under test according to the high frequency clock, and it performs a low speed operation according to a low frequency clock, which is for example the tester clock.
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申请公布号 |
US2012229146(A1) |
申请公布日期 |
2012.09.13 |
申请号 |
US201213410472 |
申请日期 |
2012.03.02 |
申请人 |
TING TAH-KANG;WANG GYH-BIN;WANG MING-HUNG;WU CHUN-PENG;TIEN LI-CHIN;PIECEMAKERS TECHNOLOGY, INCORPORATION |
发明人 |
TING TAH-KANG;WANG GYH-BIN;WANG MING-HUNG;WU CHUN-PENG;TIEN LI-CHIN |
分类号 |
G01R27/28 |
主分类号 |
G01R27/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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