发明名称 METHOD FOR IMPURITY INTRODUCTION
摘要 <P>PROBLEM TO BE SOLVED: To provide a method for impurity introduction by which an amorphous layer can be well formed on a surface of a substrate without fail, and a desired impurity can be introduced thereinto. <P>SOLUTION: The method for impurity introduction comprises: a first step which includes irradiating a surface of a monocrystalline silicon substrate with neon plasma to form an amorphous layer; and a second step which includes introducing an impurity into the amorphous layer. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012178474(A) 申请公布日期 2012.09.13
申请号 JP20110040928 申请日期 2011.02.25
申请人 ULVAC JAPAN LTD 发明人 TONARI KAZUHIKO
分类号 H01L21/265;H01L21/22 主分类号 H01L21/265
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