LIGHT-EMISSION STATUS MEASUREMENT DEVICE

摘要

The purpose of the present invention is to provide a light-emission status measurement device capable of measuring at high speed the light-emission status of a semiconductor light-emitting element and inspecting the semiconductor light-emitting element on the basis of the measurement results. The light-emission status measurement device (3) receives light radiated by an LED (101) and measures the light-emission status, is arranged both on the light-emission center axis of the LED (101) and facing the LED (101), and has a CCD (105) that images the light-emission status of the LED (101) and a lens unit (123) that receives incident light emitted by the LED (101) and emits light towards the CCD (105). The lens unit (123) is arranged between the LED (101) and the CCD (105), at a position closer to the LED (101) than the CCD (105).