发明名称 ACTIVE MATRIX SUBSTRATE, DISPLAY DEVICE, MANUFACTURING METHOD OR INSPECTION METHOD OF ACTIVE MATRIX SUBSTRATE, AND MANUFACTURING METHOD OR INSPECTION METHOD OF DISPLAY DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide an active matrix substrate for which a short-circuit between adjacent pull-out wires formed in the same layer is surely detected by a simple configuration when the pull-out wires are formed in each of the plurality of layers. <P>SOLUTION: An active matrix substrate 2 includes: first connection wires 64<SB POS="POST">1</SB>, 64<SB POS="POST">3</SB>, 64<SB POS="POST">5</SB>and 64<SB POS="POST">7</SB>connected to a gate terminal 51 to which the pull-out wires 61<SB POS="POST">1</SB>, 61<SB POS="POST">3</SB>, 61<SB POS="POST">5</SB>and 61<SB POS="POST">7</SB>are connected; second connection wires 64<SB POS="POST">2</SB>, 64<SB POS="POST">4</SB>and 64<SB POS="POST">6</SB>connected to the gate terminal 51 to which the pull-out wires 61<SB POS="POST">2</SB>, 61<SB POS="POST">4</SB>and 61<SB POS="POST">6</SB>are connected; binding wires 65<SB POS="POST">1</SB>-65<SB POS="POST">4</SB>for binding two first connection wires and second connection wires adjacent to each other into one; a first inspection wire 66 capable of inputting inspection signals to the binding wires 65<SB POS="POST">2</SB>and 65<SB POS="POST">4</SB>not adjacent to each other among the binding wires; and a second inspection wire 67 capable of inputting inspection signals to the binding wires 65<SB POS="POST">1</SB>and 65<SB POS="POST">3</SB>to which the first inspection wire 66 is not connected and which are not adjacent to each other among the binding wires. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012177927(A) 申请公布日期 2012.09.13
申请号 JP20120096671 申请日期 2012.04.20
申请人 SHARP CORP 发明人 YOSHIDA MASAHIRO;KAWAMURA TAKEHIKO;OKADA KATSUHIRO
分类号 G09F9/30;G02F1/1345;G09F9/00 主分类号 G09F9/30
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