发明名称 SPECTRAL CHARACTERISTIC MEASUREMENT METHOD AND SPECTRAL CHARACTERISTIC MEASUREMENT APPARATUS
摘要 A spectral characteristic measurement method for measuring spectral characteristics of measured light with higher accuracy is provided. The spectral characteristic measurement method includes causing an optical measurement instrument having detection sensitivity in a first wavelength range to receive light in a second wavelength range which is a part of the first wavelength range, obtaining characteristic information indicating a stray light component from a portion of a first spectrum detected by the optical measurement instrument, that corresponds to a range other than the second wavelength range, and obtaining a pattern indicating a stray light component generated in the optical measurement instrument by subjecting the characteristic information to extrapolation processing as far as the second wavelength range in the first wavelength range.
申请公布号 US2012229803(A1) 申请公布日期 2012.09.13
申请号 US201213397681 申请日期 2012.02.16
申请人 SANO HIROYUKI;TAGUCHI KUNIKAZU;OTSUKA ELECTRONICS CO., LTD. 发明人 SANO HIROYUKI;TAGUCHI KUNIKAZU
分类号 G01J3/00 主分类号 G01J3/00
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