DEVICE FOR INSPECTING THIN-FILM SOLAR CELL, METHOD FOR INSPECTING THIN-FILM SOLAR CELL, METHOD FOR PRODUCING THIN-FILM SOLAR CELL, AND SYSTEM FOR PRODUCING THIN-FILM SOLAR CELL

摘要

When inspecting the insulation performance of thin-film solar cells, there has been the problem of not knowing the location of insulation defects. Thus, there has been the problem that it has not been possible to eliminate the causative agents of insulation defects in light of having identified the location of insulation defects, and the production characteristics of thin-film solar cells did not rise. This device (K1) for inspecting thin-film solar cells is characterized by a terminal being divided into a plurality of individual terminals, each of which is provided with a moving mechanism (711-738), and each of the individual terminals being caused to make contact. Using the inspection device, it is possible to identify locations of insulation defects by inspecting the insulation performance of a thin-film solar cell.