| 摘要 |
The purpose of the present invention is to provide a light-emission status measurement method for a semiconductor light-emitting element, capable of measuring the light-emission status of the semiconductor light-emitting element by using a simple configuration. The light-emission status measurement method for an LED (101) is a method for measuring the light-emission status of light radiated from the LED (101) and has: a light emission step, in which power is supplied to an electrode in the LED (101) and the LED (101) is caused to emit light; a composite light measurement step in which reflected light, reflected by a reflection unit (123) which reflects light radiated by the LED (101), and direct light, radiated by the LED (101) but not reflected by the reflection unit (123), are received by a light-reception unit and composite received-light information is measured; and a direct light measurement step in which only the direct light, radiated by the LED (101) and not reflected by the reflection unit (123), is received and the direct received-light information is measured by the light-reception unit.
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