摘要 |
The invention relates to a radiation detector (10), in particular for detecting x-ray radiation, comprising a carrier substrate (11), a detector layer (12) which comprises GaN, is arranged on the carrier substrate (11) and has a thickness less than 50 µm, and contact electrodes (13) which form ohmic contacts with the detector layer (12). The invention also relates to a measurement device which is equipped with at least one such radiation detector (10). |
申请人 |
HELMHOLTZ ZENTRUM MUENCHEN DEUTSCHES FORSCHUNGSZENTRUM FUER GESUNDHEIT UND UMWELT (GMBH);THALHAMMER, STEFAN;HOFSTETTER, MARKUS;HOWGATE, JOHN;STUTZMANN, MARTIN |
发明人 |
THALHAMMER, STEFAN;HOFSTETTER, MARKUS;HOWGATE, JOHN;STUTZMANN, MARTIN |