发明名称 INSPECTION APPARATUS AND METHOD OF LIGHT EMITTING DEVICE
摘要 PURPOSE: A light emitting diode inspection device and method are provided to inspect electric characteristics, optical characteristics and the defect of appearance state of a light emitting diode. CONSTITUTION: A probing unit(400) comprises a table in which a light emitting diode is loaded and a probe which supplies a current to the light emitting diode. An image acquiring unit(200) obtains an image of the light emitting diode. A determining unit(300) detects whether a light emitting cell emits light or not from luminance information of the image. The determining unit determines the open/short failure of the light emitting diode. A measuring unit(100) comprises an integrating sphere(120) and a detector(110). The integrating sphere collects light emitted from the light emitting diode by being placed on the upper side of the table. The detector detects optical characteristic of the light emitting diode from the integration sphere.
申请公布号 KR101182822(B1) 申请公布日期 2012.09.13
申请号 KR20110028209 申请日期 2011.03.29
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JI, WON SOO;PARK, DAE SEO;KIM, CHOO HO
分类号 G01R31/26 主分类号 G01R31/26
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