发明名称 WIDE BANDGAP TRANSISTORS WITH GATE-SOURCE FIELD PLATES
摘要 <P>PROBLEM TO BE SOLVED: To reduce difference between DC and RF characteristics caused by electron trapping. <P>SOLUTION: A transistor 10 comprising an active region having a channel layer, with source and drain electrodes 20, 22 formed in contact with the active region and a gate 24 formed between the source and drain electrodes and in contact with the active region. A spacer layer 28 is on at least part of the surface of the plurality of active region between the gate and drain electrodes and between the gate and source electrodes. A field plate 32 is on the spacer layer and extends on the spacer over the active region toward the drain electrode. The field plate also extends on the spacer layer over the active region toward the source electrode. At least one conductive path 34, 36 electrically connects the field plate to the source electrode or the gate. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012178595(A) 申请公布日期 2012.09.13
申请号 JP20120107672 申请日期 2012.05.09
申请人 CREE INC 发明人 WU YIFENG;PARIKH PRIMIT;MISHRA UMESH;SCOTT SHEPPARD
分类号 H01L21/338;H01L29/778;H01L29/812 主分类号 H01L21/338
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