发明名称 ELECTRONIC DEVICE INTEGRITY MONITORING APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide an electronic device integrity monitoring apparatus which can monitor integrity of an electronic device which outputs a control signal to operational equipment, monitor a generic failure by providing a control part and a monitoring part, and also detect degradation degrees of the control part and the monitoring part. <P>SOLUTION: A storage part (24, 27) stores a first reference value of an input/output electric signal into/from a control part 23 and a second reference value of an input/output electric signal into/from a monitoring part 26. When the amount of deviation between the input/output electric signal into/from the control part 23 and the first reference value exceeds a threshold value, a first caution signal output part 25 detects degradation of the control part 23 and outputs a caution signal. When the amount of deviation between the input/output electric signal into/from the monitoring part 26 and the second reference value exceeds a threshold value, a second caution signal output part 28 detects degradation of the monitoring part 26 and outputs a caution signal. The first and second reference values are obtained and stored in the storage part (24, 27) in a period between completion of production of the control part 23 and the monitoring part 26 and start of operation thereof. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012176645(A) 申请公布日期 2012.09.13
申请号 JP20110039530 申请日期 2011.02.25
申请人 NABTESCO CORP 发明人 NAKAGAWA SHINGO
分类号 B64C13/00;B64C13/50 主分类号 B64C13/00
代理机构 代理人
主权项
地址