发明名称 THREE-DIMENSIONAL SHAPE MEASUREMENT INSTRUMENT AND THREE-DIMENSIONAL SHAPE MEASUREMENT METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a three-dimensional shape measurement instrument capable of accurately calculating a height of solder. <P>SOLUTION: An approximation surface of a wiring pattern is prepared for an inspection block prior to application of solder (S22). Furthermore, an approximation surface of lands is prepared for the inspection block prior to the application of solder (S23). Then, based on the prepared approximation surface Sr of the wiring pattern and the approximation surface Sl of the lands, an offset, namely, a distance between the approximation surface Sr of the wiring pattern and the approximation surface Sl of the lands is calculated (S24). The calculated offset is recorded in a RAM or the like (S25). After the application of solder, the stored offset is read out to calculate the height of the solder. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012177611(A) 申请公布日期 2012.09.13
申请号 JP20110040511 申请日期 2011.02.25
申请人 OMRON CORP 发明人 OGINO YUKI;HONMA TOMONORI;WADA HIROTAKA
分类号 G01B11/25;G01B11/02;G06T1/00 主分类号 G01B11/25
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