发明名称 PLASMA PROCESSING APPARATUS
摘要 PURPOSE: A plasma processing apparatus is provided to perform a plurality of plasma etching process in a single process chamber by controlling plasma more precisely. CONSTITUTION: A process chamber(11) forms a process space inside. A bottom electrode includes a placement table(12) for putting on a processed substrate. An upper electrode is arranged to face the bottom electrode in the process chamber. A high frequency power source applies high frequency power to the bottom electrode. A process gas supply device supplies process gas which is turned to be plasma to the process space. A first ground member(61) forms a ground potential in the process chamber. A second ground member(62) faces the first ground member in an exhaust space of the process chamber. A ground bar(66) is carried to the top and bottom between the first and second ground members.
申请公布号 KR20120100750(A) 申请公布日期 2012.09.12
申请号 KR20120019032 申请日期 2012.02.24
申请人 TOKYO ELECTRON LIMITED 发明人 HOSAKA YUKI;FURUYA NAOKAZU;OHATA MITSUNORI
分类号 H05H1/46;H01L21/3065 主分类号 H05H1/46
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