发明名称 METHOD OF FABRICATING A SEMICONDUCTOR DEVICE USING A BOW RESISTANT LAYER
摘要 PURPOSE: A method for manufacturing a semiconductor device by using a bowing preventing film is provided to control bowing when forming an opening having a high aspect ratio by forming a material film with an intermediate material film and a top material film and an etching ratio lower than the etching ratio of a bottom material film. CONSTITUTION: A bottom material film(210), an intermediate material film(230), and a top material film(250) are successively formed on a substrate(100). A top opening exposing the upper surface of the bottom material film is formed by etching the intermediate material film and the top material film. A bottom opening(300b) is formed by etching the bottom material film exposed by the top opening. A bit line(113) crossing a word line(105) is formed within the intermediate material film.
申请公布号 KR20120100003(A) 申请公布日期 2012.09.12
申请号 KR20110018582 申请日期 2011.03.02
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 YOON, KUK HAN;LEE, CHEOL KYU;LEE, JUN SOO;KIM, JONG KYU;KOO, SEONG MO;PARK, KI JIN
分类号 H01L21/8242;H01L21/768;H01L27/108 主分类号 H01L21/8242
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