| 摘要 |
The invention relates to a method for classifying a radiation emitting, opto-electronic semiconductor component (20) comprising the following steps: providing a radiation emitting, opto-electronic semiconductor component (20), determining the chromaticity (8) of the light emitted from the radiation emitting, opto-electronic semiconductor component (20) during operation, classifying the radiation emitting, opto-electronic semiconductor component (20) into a predefined chromaticity range (6) comprising the determined chromaticity. |
