发明名称 |
EPITAXIAL SUBSTRATE FOR SEMICONDUCTOR ELEMENT, SEMICONDUCTOR ELEMENT, AND METHOD FOR PRODUCING EPITAXIAL SUBSTRATE FOR SEMICONDUCTOR ELEMENT |
摘要 |
<p>Provided is an epitaxial substrate in which a silicon substrate is used as a base substrate, that allows a HEMT device with a high breakdown voltage to be achieved. An epitaxial substrate, in which a group of group-III nitride layers are formed on a (111) single crystal Si substrate such that a (0001) crystal plane of the group of group-III nitride layers is substantially in parallel with a surface of the substrate, includes: a first group-III nitride layer that is made of AlN and that is a layer with many defects configured of at least one kind from a columnar or granular crystal or domain; a second group-III nitride layer whose interface with the first group-III nitride layer is shaped into a three-dimensional concave-convex surface; a third group-III nitride layer that is epitaxially formed on the second group-III nitride layer; and the third group-III nitride layer that is a graded composition layer in which the proportion of existence of Al is smaller in a portion closer to a fourth group-III nitride.</p> |
申请公布号 |
EP2498293(A1) |
申请公布日期 |
2012.09.12 |
申请号 |
EP20100828333 |
申请日期 |
2010.11.05 |
申请人 |
NGK INSULATORS, LTD. |
发明人 |
MIYOSHI MAKOTO;SUMIYA SHIGEAKI;ICHIMURA MIKIYA;TANAKA MITSUHIRO |
分类号 |
C23C16/02;C23C16/30;C23C16/34;C30B25/02;C30B29/38;C30B29/40;C30B29/68;H01L21/02;H01L21/205;H01L21/338;H01L29/10;H01L29/20;H01L29/47;H01L29/778;H01L29/812;H01L29/872 |
主分类号 |
C23C16/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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