发明名称 EPITAXIAL SUBSTRATE FOR SEMICONDUCTOR ELEMENT, SEMICONDUCTOR ELEMENT, AND METHOD FOR PRODUCING EPITAXIAL SUBSTRATE FOR SEMICONDUCTOR ELEMENT
摘要 <p>Provided is an epitaxial substrate in which a silicon substrate is used as a base substrate, that allows a HEMT device with a high breakdown voltage to be achieved. An epitaxial substrate, in which a group of group-III nitride layers are formed on a (111) single crystal Si substrate such that a (0001) crystal plane of the group of group-III nitride layers is substantially in parallel with a surface of the substrate, includes: a first group-III nitride layer that is made of AlN and that is a layer with many defects configured of at least one kind from a columnar or granular crystal or domain; a second group-III nitride layer whose interface with the first group-III nitride layer is shaped into a three-dimensional concave-convex surface; a third group-III nitride layer that is epitaxially formed on the second group-III nitride layer; and the third group-III nitride layer that is a graded composition layer in which the proportion of existence of Al is smaller in a portion closer to a fourth group-III nitride.</p>
申请公布号 EP2498293(A1) 申请公布日期 2012.09.12
申请号 EP20100828333 申请日期 2010.11.05
申请人 NGK INSULATORS, LTD. 发明人 MIYOSHI MAKOTO;SUMIYA SHIGEAKI;ICHIMURA MIKIYA;TANAKA MITSUHIRO
分类号 C23C16/02;C23C16/30;C23C16/34;C30B25/02;C30B29/38;C30B29/40;C30B29/68;H01L21/02;H01L21/205;H01L21/338;H01L29/10;H01L29/20;H01L29/47;H01L29/778;H01L29/812;H01L29/872 主分类号 C23C16/02
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