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发明名称
晶片测试机与晶片测试方法
摘要
本发明揭露一种晶片测试机,包含:至少一晶片插座以及至少一晶片取放装置。该晶片取放装置具有一取放机构及一下压机构,该下压机构具有一测试光源。
申请公布号
TWI372254
申请公布日期
2012.09.11
申请号
TW097128345
申请日期
2008.07.25
申请人
京元电子股份有限公司 新竹市公道五路2段81号
发明人
温进光
分类号
G01R31/28
主分类号
G01R31/28
代理机构
代理人
陈达仁 台北市中山区长春路156号5楼
主权项
地址
新竹市公道五路2段81号
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