发明名称 Ion beam device
摘要 Provided is an ion beam device provided with a gas electric field ionization ion source which can prevent an emitter tip from vibrating in a non-contact manner. The gas electric field ionization ion source is comprised of an emitter tip (21) for generating ions; an emitter base mount (64) for supporting the emitter tip; an ionizing chamber which has an extraction electrode (24) opposed to the emitter tip and which is configured so as to surround the emitter tip (21); and a gas supply tube (25) for supplying gas to the vicinity of the emitter tip. The emitter base mount and a vacuum container magnetically interact with each other.
申请公布号 US8263943(B2) 申请公布日期 2012.09.11
申请号 US201013144620 申请日期 2010.01.08
申请人 SHICHI HIROYASU;MATSUBARA SHINICHI;SAHO NORIHIDE;ARAI NORIAKI;ISHITANI TOHRU;HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 SHICHI HIROYASU;MATSUBARA SHINICHI;SAHO NORIHIDE;ARAI NORIAKI;ISHITANI TOHRU
分类号 H01J49/10;H01J37/28 主分类号 H01J49/10
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