| 摘要 |
<P>PROBLEM TO BE SOLVED: To measure a measuring value about a measuring object signal with high accuracy while suppressing increase of a device cost. <P>SOLUTION: A measuring device is provided with a signal processing section 7 for: creating divided data constituted of the certain number of waveform data Dw by dividing the waveform data Dw for every certain section, which are obtained by sampling the measuring object signal Si with a fixed sampling period; also executing a windowing process to any one of data before the windowing process of the divided data or calculation data calculated based on the divided data; and calculating a measurement value Dm for the measuring object signal Si based on data after the windowing process to which the windowing process is executed. When the number of waveforms of a fundamental wave about the measuring object signal Si included in the certain section is the preliminarily stipulated reference number or more, the signal processing section 7 calculates the measurement value Dm based on the data after the windowing process, and the measurement value Dm is calculated based on the data before the windowing process when the number of waveforms of the fundamental wave is less than the reference number. <P>COPYRIGHT: (C)2012,JPO&INPIT |
