| 摘要 |
<P>PROBLEM TO BE SOLVED: To downsize a device configuration. <P>SOLUTION: A testing device comprises: a first buffer part and a second buffer part that buffer fail data and address data; an address fail memory part that writes the fail data buffered by the first buffer part in an address shown by the address data corresponding to the fail data in an internal memory by RMW processing; and a control part that supplies the fail data and the address data output from a testing part to the second buffer part in place of the first buffer part when an amount of space in the first buffer part becomes equal to or less than a predetermined first threshold in such a state that the fail data and the address data output from the testing part are supplied to the first buffer part. <P>COPYRIGHT: (C)2012,JPO&INPIT |
