发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF |
摘要 |
PURPOSE: A semiconductor device and a manufacturing method thereof are provided to suppress a short channel effect by appropriately setting the depth of a trench for a gate electrode. CONSTITUTION: An insulating layer(130) is formed on a semiconductor substrate. A plurality of trenches is formed on the insulating layer. A wide gap semiconductor layer(144) is formed to cover the trench. A gate insulating layer(146) is formed between a gate electrode(148a,148b) and the wide gap semiconductor layer. A source electrode or a drain electrode is contacted to the wide gap semiconductor layer. |
申请公布号 |
KR20120099339(A) |
申请公布日期 |
2012.09.10 |
申请号 |
KR20120006582 |
申请日期 |
2012.01.20 |
申请人 |
SEMICONDUCTOR ENERGY LABORATORY CO., LTD. |
发明人 |
YAMAZAKI SHUNPEI;GODO HIROMICHI |
分类号 |
H01L29/78;H01L21/336 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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