发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 PURPOSE: A semiconductor device and a manufacturing method thereof are provided to suppress a short channel effect by appropriately setting the depth of a trench for a gate electrode. CONSTITUTION: An insulating layer(130) is formed on a semiconductor substrate. A plurality of trenches is formed on the insulating layer. A wide gap semiconductor layer(144) is formed to cover the trench. A gate insulating layer(146) is formed between a gate electrode(148a,148b) and the wide gap semiconductor layer. A source electrode or a drain electrode is contacted to the wide gap semiconductor layer.
申请公布号 KR20120099339(A) 申请公布日期 2012.09.10
申请号 KR20120006582 申请日期 2012.01.20
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 YAMAZAKI SHUNPEI;GODO HIROMICHI
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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