TEST EQUIPMENT AND SEMICONDUCTOR DEVICE USING BUILT-IN INSTRUMENTS STANDARD INTERFACE,申请号KR20117003204-传众专利搜索

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发明名称	TEST EQUIPMENT AND SEMICONDUCTOR DEVICE USING BUILT-IN INSTRUMENTS STANDARD INTERFACE
摘要
申请公布号	KR101181557(B1)	申请公布日期	2012.09.10
申请号	KR20117003204	申请日期	2009.07.09
申请人		发明人
分类号	G01R31/3183;G01R31/28;G01R31/319	主分类号	G01R31/3183
代理机构		代理人
主权项
地址

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