发明名称 METHOD OF MAKING SEMICONDUCTOR STRUCTURE
摘要 FIELD: chemistry. ^ SUBSTANCE: semiconductor structure is formed by forming oxynitride porous silicon via nitration of plates with porous silicon at temperature 1000C in a diffusion furnace in an ammonia medium for 1-2 hours, followed by burning at temperature 1200C in an atmosphere of ammonia at pressure (9-10)106. ^ EFFECT: low density of defects, which provides processability, improves parameters, increases reliability and increases percentage yield. ^ 1 tbl
申请公布号 RU2461090(C1) 申请公布日期 2012.09.10
申请号 RU20100152872 申请日期 2010.12.23
申请人 FEDERAL'NOE GOSUDARSTVENNOE BJUDZHETNOE OBRAZOVATEL'NOE UCHREZHDENIE VYSSHEGO PROFESSIONAL'NOGO OBRAZOVANIJA "KABARDINO-BALKARSKIJ GOSUDARSTVENNYJ UNIVERSITET IM. KH.M. BERBEKOVA" (KBGU) 发明人 MUSTAFAEV GASAN ABAKAROVICH;MUSTAFAEV ABDULLA GASANOVICH;MUSTAFAEV ARSLAN GASANOVICH
分类号 H01L21/316 主分类号 H01L21/316
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