发明名称 |
METHOD OF MAKING SEMICONDUCTOR STRUCTURE |
摘要 |
FIELD: chemistry. ^ SUBSTANCE: semiconductor structure is formed by forming oxynitride porous silicon via nitration of plates with porous silicon at temperature 1000C in a diffusion furnace in an ammonia medium for 1-2 hours, followed by burning at temperature 1200C in an atmosphere of ammonia at pressure (9-10)106. ^ EFFECT: low density of defects, which provides processability, improves parameters, increases reliability and increases percentage yield. ^ 1 tbl |
申请公布号 |
RU2461090(C1) |
申请公布日期 |
2012.09.10 |
申请号 |
RU20100152872 |
申请日期 |
2010.12.23 |
申请人 |
FEDERAL'NOE GOSUDARSTVENNOE BJUDZHETNOE OBRAZOVATEL'NOE UCHREZHDENIE VYSSHEGO PROFESSIONAL'NOGO OBRAZOVANIJA "KABARDINO-BALKARSKIJ GOSUDARSTVENNYJ UNIVERSITET IM. KH.M. BERBEKOVA" (KBGU) |
发明人 |
MUSTAFAEV GASAN ABAKAROVICH;MUSTAFAEV ABDULLA GASANOVICH;MUSTAFAEV ARSLAN GASANOVICH |
分类号 |
H01L21/316 |
主分类号 |
H01L21/316 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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