| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a waveform comparison method and a test device for determining equivalence between waveforms. <P>SOLUTION: A waveform comparison method includes the steps of: detecting initial change points in waveforms; performing sampling based on the initial change points; and comparing sampling values sampled based on the initial change points detected for the first waveform and second waveform. <P>COPYRIGHT: (C)2012,JPO&INPIT |
