发明名称 BEND SENSOR
摘要 <P>PROBLEM TO BE SOLVED: To provide a bend sensor having high spatial resolution and enabling highly accurate measurement. <P>SOLUTION: The bend sensor has a first thin film transistor and a second thin film transistor on a flexible substrate. The substrate includes a flexible area and an inflexible area. The first thin film transistor and the second thin film transistor form a differential transistor pair. The first thin film transistor is formed in the flexible area and the second thin film transistor is formed in the inflexible area. Since the thin film transistors can be formed in micrometers, there can be provided the bend sensor having extremely high spatial resolution of several micrometers. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012173141(A) 申请公布日期 2012.09.10
申请号 JP20110035503 申请日期 2011.02.22
申请人 SEIKO EPSON CORP 发明人
分类号 G01B7/16 主分类号 G01B7/16
代理机构 代理人
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