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发明名称
Test Handler and Method for Testing Semiconductor Device
摘要
申请公布号
KR101180836(B1)
申请公布日期
2012.09.07
申请号
KR20100131028
申请日期
2010.12.20
申请人
发明人
分类号
G01R31/26;H01L21/66
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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