APPARATUS FOR PROJECTING A GRID PATTERN

摘要

The present invention relates to an apparatus for projecting a grid pattern, and more particularly, to an apparatus for projecting a grid pattern that projects an image of a grid pattern onto a test object during a three-dimensional measurement. The apparatus for projecting a grid pattern comprises: a camera which takes, as an input, a grid pattern image using grid pattern projecting means including a grid pattern signal generating unit and a grid pattern emitting unit, wherein the grid pattern signal generating unit receives grid pattern information to emit light in the form of grid pattern onto the test object and generates a grid pattern signal, and controls the grid pattern signal, wherein the grid pattern emitting unit controls a micro-mirror for a light source and a laser scanner using the grid pattern signal to emit a grid pattern; information processing means for extracting a three-dimensional image; and output means. According to the present invention, the size of the apparatus for projecting a grid pattern may be reduced such that the apparatus may be internally or externally built into a mobile device or three-dimensional measurement device. The apparatus for projecting a grid pattern of the present invention may solve the focusing problems of conventional apparatuses for projecting a grid pattern, and may project a grid pattern image to a high-speed camera in real time to perform a three-dimensional measurement.