| 摘要 |
Systems for inspecting clearances in a machine are disclosed. In one embodiment, an apparatus for inspecting a clearance in a machine includes: a base bracket configured to be disposed upon at least one rotor land within the machine; an optical device disposed upon the base bracket, the optical device for capturing an image of at least a portion of the machine wherein the image depicts at least one clearance in the machine; and a computing device communicatively connected to the optical device, the computing device for obtaining and processing the image of at least a portion of the machine from the optical device and determining at least one clearance value from the image.
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