发明名称 |
NONVOLATILE MEMORY DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a nonvolatile memory device capable of preventing a reliability drop due to a reduction in read margin, by providing a driving signal with a same rising slope to a memory cell array. <P>SOLUTION: A nonvolatile memory device in an embodiment of the present invention comprises: a memory cell array including a plurality of memory cells stacked in a direction perpendicular to a substrate; a row selecting circuit coupled with the memory cell array via a word line; and a voltage generator circuit that generates a voltage provided to the word line. The voltage generator circuit generates the voltage in a method of gradually increasing the voltage to a target voltage level. The nonvolatile memory device in the embodiment of the present invention can provide a driving signal with a same rising slope to the memory cell array. Therefore, it is possible to prevent a reliability drop due to a reduction in read margin. <P>COPYRIGHT: (C)2012,JPO&INPIT |
申请公布号 |
JP2012169027(A) |
申请公布日期 |
2012.09.06 |
申请号 |
JP20110281048 |
申请日期 |
2011.12.22 |
申请人 |
SAMSUNG ELECTRONICS CO LTD |
发明人 |
PARK JUN-HUN;KANG KYUNG-HWA;NAN SHANG WAN;YOON SEONG-WON;YOON CHI-WEON |
分类号 |
G11C16/06;G11C16/02;H01L21/336;H01L21/8234;H01L21/8247;H01L27/088;H01L27/10;H01L27/115;H01L29/788;H01L29/792 |
主分类号 |
G11C16/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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