发明名称 MASS SPECTROMETER METHOD AND MASS SPECTROMETER
摘要 A variation in an ionization efficiency and the amount of sample which is introduced into an ion trap is corrected and quantified. Ions of an internal standard and ions of a sample are trapped in the ion trap at the same time, and a concentration of the sample is quantified according to an intensity of the ions of the internal standard which are mass-selectively ejected, and an intensity of fragment ions of the sample.
申请公布号 US2012223223(A1) 申请公布日期 2012.09.06
申请号 US201213365355 申请日期 2012.02.03
申请人 SUGIYAMA MASUYUKI;HASHIMOTO YUICHIRO;HASEGAWA HIDEKI;HASHIBA SHUHEI;KUMANO SHUN;HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 SUGIYAMA MASUYUKI;HASHIMOTO YUICHIRO;HASEGAWA HIDEKI;HASHIBA SHUHEI;KUMANO SHUN
分类号 H01J49/26;H01J49/00 主分类号 H01J49/26
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