发明名称 |
MASS SPECTROMETER METHOD AND MASS SPECTROMETER |
摘要 |
A variation in an ionization efficiency and the amount of sample which is introduced into an ion trap is corrected and quantified. Ions of an internal standard and ions of a sample are trapped in the ion trap at the same time, and a concentration of the sample is quantified according to an intensity of the ions of the internal standard which are mass-selectively ejected, and an intensity of fragment ions of the sample.
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申请公布号 |
US2012223223(A1) |
申请公布日期 |
2012.09.06 |
申请号 |
US201213365355 |
申请日期 |
2012.02.03 |
申请人 |
SUGIYAMA MASUYUKI;HASHIMOTO YUICHIRO;HASEGAWA HIDEKI;HASHIBA SHUHEI;KUMANO SHUN;HITACHI HIGH-TECHNOLOGIES CORPORATION |
发明人 |
SUGIYAMA MASUYUKI;HASHIMOTO YUICHIRO;HASEGAWA HIDEKI;HASHIBA SHUHEI;KUMANO SHUN |
分类号 |
H01J49/26;H01J49/00 |
主分类号 |
H01J49/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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