发明名称 METHOD OF FORMING AN ELECTRICAL FUSE AND A METAL GATE TRANSISTOR AND THE RELATED ELECTRICAL FUSE
摘要 The present invention provides a method of integrating an electrical fuse process into a high-k/metal gate process. The method simultaneously forms a dummy gate stack of a transistor and a dummy gate stack of an e-fuse; and simultaneously removes the polysilicon of the dummy gate stack in the transistor region and the polysilicon of the dummy gate stack in the e-fuse region. Thereafter, the work function metal layer disposed in the opening of the e-fuse region is removed; and the opening in the transistor region and the opening in the e-fuse region with metal conductive structures are filled to form an e-fuse and a metal gate of a transistor.
申请公布号 US2012225524(A1) 申请公布日期 2012.09.06
申请号 US201213469069 申请日期 2012.05.10
申请人 LIN YUNG-CHANG;WU KUEI-SHENG;WONG CHANG-CHIEN;UNITED MICROELECTRONICS CORP. 发明人 LIN YUNG-CHANG;WU KUEI-SHENG;WONG CHANG-CHIEN
分类号 H01L21/8232 主分类号 H01L21/8232
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