发明名称 ELECTRIC FIELD PROBE AND ELECTRIC FIELD MEASURING DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To improve accuracy in measuring an electric field in an electric field probe and an electric field measuring device. <P>SOLUTION: An electric field probe 1 comprises a central conductor 2, a dielectric substance 3 provided on an outer circumference of the central conductor 2, and an outer conductor 4 provided on an outer circumference of the dielectric substance 3. Since the outer circumference of the outer conductor 4 is coated with a lossy material part 5, extension of a line of electric force toward a surface of the outer conductor 4, which may occur in a comparative probe 11, may be suppressed. Since the extension of the line of electric force may be suppressed in a region surrounded with a broken line E in the electric field probe 1, accurate electric field intensity with high similarity to a theoretical value may be detected. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012168079(A) 申请公布日期 2012.09.06
申请号 JP20110030545 申请日期 2011.02.16
申请人 FUJITSU LTD 发明人 KOGA YOHEI;YAMAGASHIRO HISASHI
分类号 G01R29/08 主分类号 G01R29/08
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