发明名称 |
INTERNAL VOLTAGE GENERATOR OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: An internal voltage generating circuit of a semiconductor device is provided to stably maintain a level of an internal voltage for a test with a target level by limiting a voltage level varying section of the internal voltage for the test above a preset voltage level. CONSTITUTION: A normal reference voltage generating unit generates a normal reference voltage with a constant voltage level regardless of the variation of a PVT. A test reference voltage generating unit(320) generates a test reference voltage by distributing a voltage level between an external power voltage and a normal reference voltage with a preset ratio. A test boosting voltage generating unit(340A) generates a test boosting voltage by a charge pumping operation based on the level of the test reference voltage. [Reference numerals] (300) Normal reference voltage generating unit; (324) Test power voltage generating unit; (340A) Test boosting voltage generating unit
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申请公布号 |
KR20120098169(A) |
申请公布日期 |
2012.09.05 |
申请号 |
KR20110017938 |
申请日期 |
2011.02.28 |
申请人 |
SK HYNIX INC. |
发明人 |
LEE, KANG SEOL;OH, SANG MOOK |
分类号 |
G11C5/14;G11C29/00 |
主分类号 |
G11C5/14 |
代理机构 |
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地址 |
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