X-ray In-line Grating Interferometer,申请号KR20100048865-传众专利搜索

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发明名称	X-ray In-line Grating Interferometer
摘要
申请公布号	KR101180067(B1)	申请公布日期	2012.09.05
申请号	KR20100048865	申请日期	2010.05.25
申请人		发明人
分类号	G01B9/02;G01N23/04;G02B5/18	主分类号	G01B9/02
代理机构		代理人
主权项
地址

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