发明名称
摘要 PROBLEM TO BE SOLVED: To provide a device and method for measurement of an error rate, capable of simply setting parameter values necessary in performing a bit error rate of a tested device or waveform measurement and display. SOLUTION: When tracking setting of any one measurement unit of an error rate measurement unit 11 or a waveform measurement unit 13 by prescribed operation from an operation input unit 16 is switched on, a control unit 18 inquires the parameter values of the other measurement unit to output them to the measurement unit of a side set in tracking-on. The measurement unit of the side set in tracking-on reflects inquired parameter values to the measurement unit in which tracking setting is in an on state so as to achieve synchronization of the parameter values. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP5016663(B2) 申请公布日期 2012.09.05
申请号 JP20090298041 申请日期 2009.12.28
申请人 发明人
分类号 G01R31/319;H04L1/00 主分类号 G01R31/319
代理机构 代理人
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